The Precession Electron
Device Spinning Star will change your conventional
TEM into a powerful crystallography study tool.
Any diffraction pattern recorded in precession
conditions shows quantitative data of the
diffraction pattern, practically free of dynamical
effects. This unique feature allows to observe the
true symmetries of the (nano) crystal being
observed. It permits also to record the true
intensities on each diffraction spot, giving
access to calculation of the crystal structure.
This feature makes now readily available structure
determination on nanocrystals, using your
conventional TEM.
Features
SPINNING STAR can easily be retrofitted to any (old or
new) 100- 400 kV TEM
Precession is possible for any beam size 300 – 10 nm ( or
less )
Precession is possible for parallel or convergent beam
SPINNING STAR may ENHANCE OR UPGRADE capabilities of
new or older TEMs
Precession angle can vary continuously (0 - 70 mrad ) to
reveal true crystal symmetry.
Orientation Mapping in the
TEM. This new system developed by NanoMEGAS allows
to scan a region of any TEM sample, record
diffraction patterns at high speed, and compare
each of them with patterns stored in a dedicated
database. This allows to determine the crystalline
orientation of the sample at each point, resulting
in an orientation mapping, similar to the EBSD
mapping done in the SEM, but with a better spatial
resolution and directly on the TEM sample. Used
conjointly, the precession diffraction allows to
highly better the diffraction patterns and to get
much more reliable maps in short time.
Features
ASTAR can easily be retrofitted to any (old or new)
100- 400 kV TEM
TEM based technique similar to EBSD for SEM (with
much higher resolution details)
Perform detailed orientation maps (Orientation
resolution < 1º , < 5 nm step size) for metals, ceramics
, semiconductors and any type of diffracting
material, any crystal symmetry, no sample preparation
Ultra-fast data acquisition (< 5 min ) (eg. 5 x 5
microns, 500 x 500 points) with CCD camera
Scanning in combination with precession for accurate
orientation and phase maps
Generation of simulated ED patterns (templates) for
all possible crystal symmetries and comparison with
experimental ED patterns via cross – correlation
techniques. to retrieve accurate phase and orientation
