Transmission Electron Microscope (TEM) allows to study nm size crystals. By tilting (manually/automatically) around
an arbitrary axis a single nanocrystal (tilt range usually > 120º e.g. 120 diffraction patterns with 1º) in combination
with precession electron diffraction (PED), the reciprocal cell can be reconstructed and crystal cell parameters can be
evaluated automatically and precisely (error 2-5%). Reflection intensities can also be measured automatically
(Completeness of reciprocal space>60%) to enable the solution of the crystal structure.